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1

[IEEE 2010 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2010.06.15-2010.06.17)] 2010 Symposium on VLSI Technology - Enhanced performance in SOI FinFETs with low series resistance by aluminum implant as a solution beyond 22nm node

Ok, I., Young, C. D., Loh, W. Y., Ngai, T., Lian, S., Oh, J., Rodgers, M. P., Bennett, S., Stamper, H. O., Franca, D. L., Lin, S., Akarvardar, K., Smith, C., Hobbs, C., Kirsch, P., Jammy, R.

Year:

2010

Language:

english

File:

PDF, 906 KB

english, 2010

2

Enhanced coupling effects in vertical double-gate FinFETs

Chang, Sung-Jae, Bawedin, Maryline, Guo, Yufeng, Liu, Fanyu, Akarvardar, Kerem, Lee, Jong-Hyun, Lee, Jung-Hee, Ionica, Irina, Cristoloveanu, Sorin

Journal:

Solid-State Electronics

Year:

2014

Language:

english

File:

PDF, 5.06 MB

english, 2014

3

High-temperature performance of state-of-the-art triple-gate transistors

K. Akarvardar, A. Mercha, E. Simoen, V. Subramanian, C. Claeys, P. Gentil, S. Cristoloveanu

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 378 KB

english, 2007

4

Subthreshold slope modulation in G4-FET transistors

B. Dufrene, B. Blalock, S. Cristoloveanu, K. Akarvardar, T. Higashino, M. Mojarradi

Journal:

Microelectronic Engineering

Year:

2004

Language:

english

File:

PDF, 299 KB

english, 2004

5

Thin film fully-depleted SOI four-gate transistors

K. Akarvardar, S. Cristoloveanu, M. Bawedin, P. Gentil, B.J. Blalock, D. Flandre

Journal:

Solid-State Electronics

Year:

2007

Language:

english

File:

PDF, 1.00 MB

english, 2007

6

Ground deformation in an area later damaged by an earthquake: monitoring the Avcilar district of Istanbul, Turkey, by satellite radar interferometry 1992–1999

Samuray Akarvardar, Kurt L. Feigl, Semih Ergintav

Journal:

Geophysical Journal International

Year:

2009

Language:

english

File:

PDF, 1.78 MB

english, 2009

7

Impact of NiPt Thickness Scaling on Contact Resistance From Thin-Body FD SOI to Trigate FETs

Akarvardar, K., Rodgers, M., Kaushik, V., Johnson, C.S., Hyuncher Chong, Injo Ok, Kah-Wee Ang, Gausepohl, S., Hobbs, C., Kirsch, P., Jammy, R.

Journal:

IEEE Electron Device Letters

Year:

2012

Language:

english

File:

PDF, 550 KB

english, 2012

8

Low-frequency noise in SOI four-gate transistors

Akarvardar, K., Dufrene, B.M., Cristoloveanu, S., Gentil, P., Blalock, B.J., Mojarradi, M.M.

Journal:

IEEE Transactions on Electron Devices

Year:

2006

Language:

english

File:

PDF, 667 KB

english, 2006

9

A Two-Dimensional Model for Interface Coupling in Triple-Gate Transistors

Akarvardar, K., Mercha, A., Cristoloveanu, S., Gentil, P., Simoen, E., Subramanian, V., Claeys, C.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 1.05 MB

english, 2007

10

(110) and (100) Sidewall-oriented FinFETs: A performance and reliability investigation

Young, C.D., Akarvardar, K., Baykan, M.O., Matthews, K., Ok, I., Ngai, T., Ang, K.-W., Pater, J., Smith, C.E., Hussain, M.M., Majhi, P., Hobbs, C.

Journal:

Solid-State Electronics

Year:

2012

Language:

english

File:

PDF, 1.48 MB

english, 2012

11

Characterization of heavily doped SOI wafers under pseudo-MOSFET configuration

Liu, F.Y., Diab, A., Ionica, I., Akarvardar, K., Hobbs, C., Ouisse, T., Mescot, X., Cristoloveanu, S.

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 889 KB

english, 2013

12

(Invited) Electrical Characterization and Reliability Assessment of Double-Gate FinFETs

Young, C. D., Akarvardar, K., Matthews, K., Baykan, M. O., Pater, J., Ok, I., Ngai, T., Ang, K.-W., Minakais, M., Bersuker, G., Deora, S., Hobbs, C., Kirsch, P., Jammy, R.

Journal:

ECS Transactions

Year:

2013

Language:

english

File:

PDF, 207 KB

english, 2013

13

[ACM Press the 2009 International Conference - San Jose, California (2009.11.02-2009.11.05)] Proceedings of the 2009 International Conference on Computer-Aided Design - ICCAD '09 - Nanoelectromechanical (NEM) relays integrated with CMOS SRAM for improved stability and low leakage

Chong, Soogine, Akarvardar, Kerem, Parsa, Roozbeh, Yoon, Jun-Bo, Howe, Roger T., Mitra, Subhasish, Wong, H.-S. Philip

Year:

2009

Language:

english

File:

PDF, 886 KB

english, 2009

14

[IEEE 2016 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2016.12.3-2016.12.7)] 2016 IEEE International Electron Devices Meeting (IEDM) - A 7nm FinFET technology featuring EUV patterning and dual strained high mobility channels

Xie, R., Montanini, P., Akarvardar, K., Tripathi, N., Haran, B., Johnson, S., Hook, T., Hamieh, B., Corliss, D., Wang, J., Miao, X., Sporre, J., Fronheiser, J., Loubet, N., Sung, M., Sieg, S., Mochizu

Year:

2016

Language:

english

File:

PDF, 746 KB

english, 2016

15

A Density Metric for Semiconductor Technology [Point of View]

Wong, H.-S. Philip, Akarvardar, Kerem, Antoniadis, Dimitri, Bokor, Jeffrey, Hu, Chenming, King-Liu, Tsu-Jae, Mitra, Subhasish, Plummer, James D., Salahuddin, Sayeef

Journal:

Proceedings of the IEEE

Year:

2020

File:

PDF, 1.47 MB

2020

16

Finite element analysis and analytical simulations of Suspended Gate-FET for ultra-low power inverters

Dimitrios Tsamados, Yogesh Singh Chauhan, Christoph Eggimann, Kerem Akarvardar, H.-S. Philip Wong, Adrian Mihai Ionescu

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 667 KB

english, 2008

17

Evidence of Radiation-Induced Dopant Neutralization in Partially-Depleted SOI NMOSFETs

Akarvardar, Kerem, Schrimpf, Ronald D., Fleetwood, Daniel M., Cristoloveanu, Sorin, Gentil, Pierre, Blalock, Benjamin J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 577 KB

english, 2007

18

Analytical Modeling of the Suspended-Gate FET and Design Insights for Low-Power Logic

Akarvardar, K., Eggimann, C., Tsamados, D., Singh Chauhan, Y., Wan, G.C., Ionescu, A.M., Howe, R.T., Wong, H.-S.P.

Journal:

IEEE Transactions on Electron Devices

Year:

2008

Language:

english

File:

PDF, 1004 KB

english, 2008

19

Investigation of the four-gate action in G4-FETs

Dufrene, B., Akarvardar, K., Cristoloveanu, S., Blalock, B.J., Gentil, R., Kolawa, E., Mojarradi, M.M.

Journal:

IEEE Transactions on Electron Devices

Year:

2004

Language:

english

File:

PDF, 240 KB

english, 2004

20

Analytical modeling of the two-dimensional potential distribution and threshold voltage of the SOI four-gate transistor

Akarvardar, K., Cristoloveanu, S., Gentil, P.

Journal:

IEEE Transactions on Electron Devices

Year:

2006

Language:

english

File:

PDF, 669 KB

english, 2006

21

Depletion-All-Around Operation of the SOI Four-Gate Transistor

Kerem Akarvardar, Sorin Cristoloveanu, Pierre Gentil, Ronald D. Schrimpf, Benjamin J. Blalock

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 1.15 MB

english, 2007

22

Impact of Fin Doping and Gate Stack on FinFET (110) and (100) Electron and Hole Mobilities

Akarvardar, K., Young, C.D., Baykan, M.O., Injo Ok, Tat Ngai, Kah-Wee Ang, Rodgers, M.P., Gausepohl, S., Majhi, P., Hobbs, C., Kirsch, P.D., Jammy, R.

Journal:

IEEE Electron Device Letters

Year:

2012

Language:

english

File:

PDF, 629 KB

english, 2012

23

[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - Strained SiGe and Si FinFETs for high performance logic with SiGe/Si stack on SOI

Ok, I., Akarvardar, K., Lin, S., Baykan, M., Young, C. D., Hung, P.Y., Rodgers, M. P., Bennett, S., Stamper, H. O., Franca, D. L., Yum, J., Nadeau, J. P., Hobbs, C., Kirsch, P., Majhi, P., Jammy, R.

Year:

2010

Language:

english

File:

PDF, 1.08 MB

english, 2010

24

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Depletion-all-around in SOI G/sup 4/-FETs: a conduction mechanism with high performance

Akarvardar, K., Cristoloveanu, S., Gentil, P., Blalock, B.J., Dufrene, B., Mojarradi, M.M.

Year:

2004

Language:

english

File:

PDF, 266 KB

english, 2004

25

[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - Design Considerations for Complementary Nanoelectromechanical Logic Gates

Akarvardar, K., Elata, D., Parsa, R., Wan, G. C., Yoo, K., Provine, J, Peumans, P., Howe, R. T., Wong, H.-S. P.

Year:

2007

Language:

english

File:

PDF, 2.22 MB

english, 2007

26

[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - A review of the SOI four-gate transistor

Cristoloveanu, Sorin, Akarvardar, Kerem, Gentil, Pierre

Year:

2006

Language:

english

File:

PDF, 340 KB

english, 2006

27

[IEEE ESSDERC 2007 - 37th European Solid State Device Research Conference - Muenchen, Germany (2007.09.11-2007.09.13)] ESSDERC 2007 - 37th European Solid State Device Research Conference - Numerical and analytical simulations of suspended gate - FET for ultra-low power inverters

Tsamados, D., Chauhan, Y.S., Eggimann, C., Akarvardar, K., Wong, H.S. Philip, Ionescu, Adrian M.

Year:

2007

Language:

english

File:

PDF, 1.49 MB

english, 2007

28

[IEEE 2004 IEEE International SOI Conference - Charleston, SC, USA (4-7 Oct. 2004)] 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) - Threshold voltage model of the SOI 4-gate transistor

Akarvardar, K., Cristoloveanu, S., Gentil, P.

Year:

2004

Language:

english

File:

PDF, 155 KB

english, 2004

29

Ultralow Voltage Crossbar Nonvolatile Memory Based on Energy-Reversible NEM Switches

K. Akarvardar, H. Wong

Journal:

IEEE Electron Device Letters

Year:

2009

Language:

english

File:

PDF, 407 KB

english, 2009

30

[IEEE 2011 11th International Workshop on Junction Technology (IWJT) - Kyoto, Japan (2011.06.9-2011.06.10)] 11th International Workshop on Junction Technology (IWJT) - Parasitic resistance reduction technology

Ok, I., Loh, W. Y., Ang, K-W, Young, C. D., Hung, P. Y., Ngai, T., Akarvardar, K., Hobbs, C., Jammy, R.

Year:

2011

Language:

english

File:

PDF, 1.39 MB

english, 2011

31

[ACM Press the 18th annual ACM/SIGDA international symposium - Monterey, California, USA (2010.02.21-2010.02.23)] Proceedings of the 18th annual ACM/SIGDA international symposium on Field programmable gate arrays - FPGA '10 - Efficient FPGAs using nanoelectromechanical relays

Chen, Chen, Wong, H.-S. Philip, Mitra, Subhasish, Parsa, Roozbeh, Patil, Nishant, Chong, Soogine, Akarvardar, Kerem, Provine, J, Lewis, David, Watt, Jeff, Howe, Roger T.

Year:

2010

Language:

english

File:

PDF, 1.54 MB

english, 2010

32

[IEEE 2012 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Technology, System and Application - Impact of thermal budget on dopant-segregated (DS) metal S/D gate-all-around (GAA) PFETs

Akarvardar, K., Rodgers, M., Kaushik, V., Johnson, C. S., Ok, I., Ang, K.-W, Stamper, H., Bennett, S., Franca, D., Rao, M., Gausepohl, S., Hobbs, C., Kirsch, P., Jammy, R.

Year:

2012

Language:

english

File:

PDF, 723 KB

english, 2012

33

[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - Technology Projection Using Simple Compact Models

Wong, H.-S. Philip, Wei, Lan, Oh, Saeroonter, Lin, Albert, Deng, Jie, Chong, Soogine, Akarvardar, Kerem

Year:

2009

Language:

english

File:

PDF, 1.30 MB

english, 2009

34

[IEEE 2012 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Technology, System and Application - Performance and variability in multi-VT FinFETs using fin doping

Akarvardar, K., Young, C. D., Veksler, D., Ang, K.-W, Ok, I., Rodgers, M., Kaushik, V., Novak, S., Nadeau, J., Baykan, M., Madan, H., Hung, P. Y., Ngai, T., Stamper, H., Bennett, S., Franca, D., Rao,

Year:

2012

Language:

english

File:

PDF, 1.02 MB

english, 2012

35

[IEEE 2007 65th Annual Device Research Conference - South Bend, IN, USA (2007.06.18-2007.06.20)] 2007 65th Annual Device Research Conference - Analytical Modeling of the Suspended-Gate FET and Design Insights for Digital Logic

Akarvardar, K., Eggimann, C., Tsamados, D., Chauhan, Y., Wan, G. C., Ionescu, A. M., Wong, H. S.-P.

Year:

2007

Language:

english

File:

PDF, 759 KB

english, 2007

36

[IEEE 2005 IEEE International SOI - Honolulu, HI, USA (03-06 Oct. 2005)] 2005 IEEE International SOI Conference Proceedings - Surface vs. Bulk Noise in SOI Four-Gate Transistors

Akarvardar, K., Dufrene, B., Cristoloveanu, S., Chroboczek, J.A., Gentil, P., Blalock, B.J., Mojarradi, M.

Year:

2005

Language:

english

File:

PDF, 968 KB

english, 2005

37

[IEEE 2006 IEEE international SOI - Niagara Falls, NY, USA (2006.10.2-2006.10.5)] 2006 IEEE international SOI Conferencee Proceedings - Four-Gate Transistor Voltage-Controlled Negative Differential Resistance Device and Related Circuit Applications

Akarvardar, K., Chen, S., Vandersand, J., Blalock, B., Schrimpf, R., Prothro, B., Britton, C., Cristoloveanu, S., Gentil1, P., Mojarradi, M.

Year:

2006

Language:

english

File:

PDF, 1.90 MB

english, 2006

38

[IEEE 2011 International Semiconductor Device Research Symposium (ISDRS) - College Park, MD, USA (2011.12.7-2011.12.9)] 2011 International Semiconductor Device Research Symposium (ISDRS) - Performance and reliability investigation of (110) and (100) sidewall oriented MugFETs

Young, C. D., Akarvardar, K., Bersuker, G., Ok, I., Ngai, T., Ang, K.-W., Hobbs, C., Kirsch, P., Jammy, R.

Year:

2011

Language:

english

File:

PDF, 193 KB

english, 2011

39

[IEEE 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005. - Grenoble, France (Sept. 12-16, 2005)] Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005. - A novel four-quadrant analog multiplier using SOI four-gate transistors (g/sup 4-FETs)

Akarvardar, K., Chen, S., Blalock, B.J., Cristoloveanu, S., Gentil, P., Mojarradi, M.

Year:

2005

Language:

english

File:

PDF, 269 KB

english, 2005

40

[IEEE 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005. - Grenoble, France (Sept. 12-16, 2005)] Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005. - SOI four-gate transistors (G/sup 4/-FETs) for high voltage analog applications

Chen, S., Vandersand, J., Blalock, B.J., Akarvardar, K., Cristoloveanu, S., Mojarradi, M.

Year:

2005

Language:

english

File:

PDF, 300 KB

english, 2005

41

[IEEE 2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03) - Newport Beach, CA, USA (2003.10.2-2003.10.2)] 2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03) - The G/sup 4/-FET: low voltage to high voltage operation and performance

Dufrene,, Akarvardar,, Cristoloveanu,, Blalock,, Fechner,, Mojarradi,

Year:

2003

Language:

english

File:

PDF, 136 KB

english, 2003

42

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - SiGe composition and thickness effects on NBTI in replacement metal gate / high-κ technologies

Srinivasan, P., Fronheiser, J., Akarvardar, K., Kerber, A., Edge, L.F., Southwick, R. G., Cartier, E., Kothari, H.

Year:

2014

Language:

english

File:

PDF, 767 KB

english, 2014

43

[IEEE 2008 66th Annual Device Research Conference (DRC) - Santa Barbara, CA, USA (2008.06.23-2008.06.25)] 2008 Device Research Conference - Energy-Reversible Complementary NEM Logic Gates

Akarvardar, Kerem, Elata, David, Howe, Roger T., Wong, H.-S. Philip

Year:

2008

Language:

english

File:

PDF, 1.18 MB

english, 2008

44

Physical insights on comparable electron transport in (100) and (110) double-gate fin field-effect transistors

Baykan, Mehmet O., Young, Chadwin D., Akarvardar, Kerem, Majhi, Prashant, Hobbs, Chris, Kirsch, Paul, Jammy, Raj, Thompson, Scott E., Nishida, Toshikazu

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 907 KB

english, 2012

45

Analog Nanoelectromechanical Relay With Tunable Transconductance

K. Akarvardar, H. Wong

Year:

2009

Language:

english

File:

PDF, 430 KB

english, 2009

46

[IEEE ESSDERC 2003. 33rd European Solid-State Device Research - ESSDERC '03 - Estoril, Portugal (16-18 Sept. 2003)] Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) - Multi-bias dependence of threshold voltage, subthreshold swing, and mobility in G/sup 4/-FETs

Akarvardar, K., Dufrene, B., Cristoloveanu, S., Blalock, B.J., Higashino, T., Mojarradi, M.M., Kolawa, E.

Year:

2003

Language:

english

File:

PDF, 291 KB

english, 2003

47

[IEEE Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Grenoble, France (12-16 Sept. 2005)] Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Evidence for reduction of noise and radiation effects in G/sup 4/-FET depletion-all-around operation

Akarvardar, K., Cristoloveanu, S., Dufrene, B., Gentil, P., Schrimpf, R.D., Blalock, B.J., Chroboczek, J.A., Mojarradi, M.

Year:

2005

Language:

english

File:

PDF, 276 KB

english, 2005

48

Total Ionizing Dose Effects on FinFET-Based Capacitor-Less 1T-DRAMs

Zhang, En Xia, Fleetwood, Daniel M., El-Mamouni, Farah, Alles, Michael L., Schrimpf, Ronald D., Xiong, Weize, Hobbs, Chris, Akarvardar, Kerem, Cristoloveanu, Sorin

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 741 KB

english, 2010

49

[IEEE 2012 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Technology, System and Application - Simple FinFET gate doping technique for dipole-engineered Vt tuning and CET scaling

Ngai, T., Hobbs, C., Veksler, D., Matthews, K., Ok, I., Akarvardar, K., Ang, K. W., Huang, J., Rodgers, M. P., Vivekanand, S., Li, H., Young, C., Majhi, P., Gausepohl, S. C., Kirsch, P., Jammy, R.

Year:

2012

Language:

english

File:

PDF, 415 KB

english, 2012

50

[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - Nanoelectromechanical Logic and Memory Devices

Akarvardar, Kerem, Wong, H.-S. Philip

Year:

2009

Language:

english

File:

PDF, 465 KB

english, 2009